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岗位聚合/Metrology Sensor Development Engineer – Interferometry
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中微公司

Metrology Sensor Development Engineer – Interferometry

⌖浦东新区社招
2 天前更新2026/11/06
JOB#65937
RESPONSIBILITIES

岗位职责

• Design and develop optical metrology subsystems using laser or white light for nanoscale surface/topography measurement.

• Collaborate with mechanical, electrical, and software teams to integrate optical sensors into inspection/metrology platforms.

• Develop optical system models (e.g., Zemax, Code V) and simulate performance to optimize sensor accuracy and resolution.

• Design and specify key optical components such as interferometers, light sources, projection optics, and detectors.

• Conduct resolution, repeatability, and accuracy analysis for sensor systems in various wafer conditions.

• Develop and validate sensor calibration procedures and alignment methodologies.

• Interface with algorithm and signal processing teams to guide image reconstruction and 3D measurement extraction.

• Perform detailed root-cause analysis of sensor performance issues and implement design improvements.

• Support cross-functional product development efforts from prototyping through production.

• Stay current with advancements in optical metrology, interferometry.

________________________________________

REQUIREMENTS

任职要求

• Master’s or PhD in Optical Engineering, Physics, or a related field.

• 5+ years of experience in optical metrology, preferably in the semiconductor industry.

• Strong understanding of interferometry, and optical measurement principles.

• Proficiency in optical design software (e.g., Zemax, Code V, or equivalent).

• Hands-on experience with lab setup, optical alignment, and prototyping.

• Familiarity with white light interferometers, confocal systems, or other 3D surface profiling technologies.

• Experience with signal processing, data acquisition, or image analysis is desirable.

• Excellent problem-solving, communication, and teamwork skills.

________________________________________

Preferred Skills:

• Experience developing sensors for CD metrology, TSV depth measurement, or wafer topography.

• Background in confocal or white light scanning interferometry.

• Familiarity with cleanroom protocols and contamination control.

✓

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岗位档案POSITION FILE
企业中微公司
地点浦东新区
类型社招
发布日期2025/08/11
更新日期2026/11/06
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